Aeroflex enables its PXI platform for LTE measurement

Staff Writer
05 Oct 2009

Aeroflex has added new long-term evolution measurement capabilities to its flexible, modular PXI 3000 platform, enabling production test engineers to achieve faster time to volume for RF components and LTE user equipment.

The new solution leverages itself on Aeroflex’s track record in LTE testing for R&D and the proven yield and throughput benefits of the PXI 3000 Series platform in mobile handset manufacturing.

Aeroflex’s new measurement suite option for the PXI 3000 allows engineers to use low-cost modular PXI equipment to characterize LTE terminals, chipsets and RF components.

The new measurement suite iscomplemented by the new LTE waveform generation capabilities of Aeroflex IQCreator software, making it ideal for LTE RF component test.

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