AT4 wireless unveils LTE RF test system

Telecom Asia Staff
02 Apr 2009

AT4 wireless said it has unveiled its T4010 LTE (Long Term Evolution) RF Test System, a "complete and cost effective test platform to perform RF parameter verification throughout the development life of LTE-enabled user equipment."

The T4010 is based on the E2010 Broadband Wireless Test Set, a powerful and expandable hardware platform that minimizes the operating costs and the amount of instruments needed in the system.

The T4010 is designed to minimize testing time, obtaining several measurement results from a single capture, and provides a high level of automation.

Applications supported by AT4 wireless T4010 LTE RF Test System cover all aspects of RF testing: functional block verification, RF parametric testing, margin search, RF performance testing and complete system validation and certification, including type approval.

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