Faster tests for phone chipsets

Staff writer
05 Nov 2009

Aeroflex said it will deliver a non-signaling solution based on its PXI 3000 series and customized for the radio frequency (RF) production line test of Infineon’s second-generation chipset, the X-GOLD 101.

Aeroflex’s PXI accelerates the development of a customized RF test solution to allow mobile phone manufacturers' need to get to market first, lower the cost of manufacturing test and optimizing valuable engineering resources.

The PXI 3000 series is able to test many more standards -- such as wireless LAN, CMA2000/1xEVDO, Wimax, UMTS, GSM/EDGE, Bluetooth and long-term evolution -- than previous “one-box solutions” could.

The series achieves up to five times higher throughput than conventional instrumentation.

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