LTE RF design verification and pre-conformance test system

Staff writer
07 Nov 2011

AT4 wireless says it has introduced the most compact and flexible LTE RF test system in the market for design verification and pre-conformance.

The new T4010 DV test system allows the creation and/or customization of dedicated RF parametric test cases, based on configurable test methods, and provides a comprehensive set of test cases following the 3GPP 36.521-1 test specifications to easily perform out-of-the-box pre-conformance testing of LTE UE designs, the company said in a statement.

Available in two hardware configurations (one-box and full system) and supporting both FDD and TDD, T4010 DV provides extensive test coverage for all existing 3GPP bands up to 3 GHz, without costly hardware upgrades. Its powerful L1 logging capabilities enable quick and straightforward debugging of implementation issues, AT4 says.

Related content

No Comments Yet! Be the first to share what you think!
This website uses cookies
This provides customers with a personalized experience and increases the efficiency of visiting the site, allowing us to provide the most efficient service. By using the website and accepting the terms of the policy, you consent to the use of cookies in accordance with the terms of this policy.