LTE RF design verification and pre-conformance test system

Staff writer
07 Nov 2011
00:00
News
Test

AT4 wireless says it has introduced the most compact and flexible LTE RF test system in the market for design verification and pre-conformance.

The new T4010 DV test system allows the creation and/or customization of dedicated RF parametric test cases, based on configurable test methods, and provides a comprehensive set of test cases following the 3GPP 36.521-1 test specifications to easily perform out-of-the-box pre-conformance testing of LTE UE designs, the company said in a statement.

Available in two hardware configurations (one-box and full system) and supporting both FDD and TDD, T4010 DV provides extensive test coverage for all existing 3GPP bands up to 3 GHz, without costly hardware upgrades. Its powerful L1 logging capabilities enable quick and straightforward debugging of implementation issues, AT4 says.

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